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半导体封装测试生产线排产研究

姚丽丽 史海波 刘昶

姚丽丽, 史海波, 刘昶. 半导体封装测试生产线排产研究. 自动化学报, 2014, 40(5): 892-900. doi: 10.3724/SP.J.1004.2014.00892
引用本文: 姚丽丽, 史海波, 刘昶. 半导体封装测试生产线排产研究. 自动化学报, 2014, 40(5): 892-900. doi: 10.3724/SP.J.1004.2014.00892
YAO Li-Li, SHI Hai-Bo, LIU Chang. Research on Scheduling in Semiconductor Assembly and Test Manufacturing. ACTA AUTOMATICA SINICA, 2014, 40(5): 892-900. doi: 10.3724/SP.J.1004.2014.00892
Citation: YAO Li-Li, SHI Hai-Bo, LIU Chang. Research on Scheduling in Semiconductor Assembly and Test Manufacturing. ACTA AUTOMATICA SINICA, 2014, 40(5): 892-900. doi: 10.3724/SP.J.1004.2014.00892

半导体封装测试生产线排产研究

doi: 10.3724/SP.J.1004.2014.00892
基金项目: 

国家重大专项资助项目(2011ZX02601-005)资助

详细信息
    作者简介:

    史海波 中国科学院沈阳自动化研究所研究员. 2003 年获得哈尔滨工业大学博士学位. 主要研究方向为生产运作与管理、制造执行系统技术.

Research on Scheduling in Semiconductor Assembly and Test Manufacturing

Funds: 

Supported by National Science and Technology Major Project of the Ministry of Science and Technology of China (2011ZX0260 1-005)

  • 摘要: 以某半导体封装测试(Semiconductor assembly and test manufacturing,ATM)企业为研究背景,对半导体封装测试的生产过程进行分析总结,提出一种新的“产能限定混线车间”(Capacity-limit flexible flow-shop,CLFFS)模型作为半导体封装测试生产线的排产模型.通过对半导体封装测试的特殊逻辑处理、排产方法以及排产规则等进行研究,提出采用逻辑约束和调度规则双层优化控制的启发式正序排产算法作为半导体封装测试的总体排产方法,同时针对批准备单处理生产阶段,提出一种新的预测开机控制优化调度方法.最后,结合CLFFS排产模型和所提出的策略方法,给出半导体封装测试排产的应用研究示例与比较,结果证明本文给定的总体排产方法在ATM中具有很好的可行性和业务逻辑嵌入的即便性,同时本文所提出的新的预测开机控制优化调度方法能够很好的缩短生产周期,提高生产效率.
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出版历程
  • 收稿日期:  2013-01-31
  • 修回日期:  2013-08-12
  • 刊出日期:  2014-05-20

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